Оборудование для промышленной автоматизации

Периферия и комплектующие — Страница 11

Built-in hardware ECC. Global wear-leveling. Flash bad-block management. S.M.A.R.T.
Built-in hardware ECC. Global wear-leveling. Flash bad-block management. S.M.A.R.T..
Built-in hardware ECC. Global wear-leveling. Flash bad-block management. S.M.A.R.T.
Built-in hardware ECC. Global wear-leveling. Flash bad-block management.
Adopts advanced LDPC ECC engine with 3D NAND flash memory to improve reliability. Global Wear Leveling. Flash bad-block management.
Adopts advanced LDPC ECC engine with 3D NAND flash memory to improve reliability. Global Wear Leveling. Flash bad-block management.
Adopts advanced LDPC ECC engine with 3D NAND SLC-liteX technology to improve reliability. Global Wear Leveling. Flash bad-block management.
Adopts advanced LDPC ECC engine with 3D NAND SLC-liteX technology to improve reliability. Global Wear Leveling. Flash bad-block management.
Compliant with SD 3.0 Specification. S.M.A.R.T supported. Support SD mode and SPI mode.
Compliant with SD 2.0 Specification. S.M.A.R.T supported. Support SD mode and SPI mode.
Compliant with CFast 2.0 specifications. Built-in ATA Secure Erase and S.M.A.R.T. Functions. Advanced wear-leveling and Block Management.
Compliant with CFA 3.0 Specification. Built-in ATA Secure Erase and S.M.A.R.T. Functions. Advanced wear-leveling and Block Management.
Built-in ATA Secure Erase and S.M.A.R.T. Functions. Advanced wear-leveling and Block Management. Power Failure Management.
Compliant with CFA 6.0 specifications. Lock switch design for write-protection. Built-in ATA Secure Erase and S.M.A.R.T. Functions.
Compliant with SD 3.0 Specification. S.M.A.R.T supported. Page mapping.
Industrial Grade SD card. S.M.A.R.T supported. Wear-Leveling and Block Management.